Innovative practices session 2C: "How is industry simplifying analog test"

Rubin A. Parekhji, Srinivas Modekurty. Innovative practices session 2C: "How is industry simplifying analog test". In 35th IEEE VLSI Test Symposium, VTS 2017, Las Vegas, NV, USA, April 9-12, 2017. pages 1, IEEE, 2017. [doi]

Abstract

Abstract is missing.