Second-level NIST Randomness Tests for Improving Test Reliability - researchr publication authors

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Fabio Pareschi, Riccardo Rovatti, Gianluca Setti. Second-level NIST Randomness Tests for Improving Test Reliability. In International Symposium on Circuits and Systems (ISCAS 2007), 27-20 May 2007, New Orleans, Louisiana, USA. pages 1437-1440, IEEE, 2007. [doi]

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