Fabio Pareschi, Riccardo Rovatti, Gianluca Setti. Second-level NIST Randomness Tests for Improving Test Reliability. In International Symposium on Circuits and Systems (ISCAS 2007), 27-20 May 2007, New Orleans, Louisiana, USA. pages 1437-1440, IEEE, 2007. [doi]
Abstract is missing.