On Combining Design for Testability Techniques

Prashant S. Parikh, Miron Abramovici. On Combining Design for Testability Techniques. In Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995. pages 423-429, IEEE Computer Society, 1995.

Authors

Prashant S. Parikh

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Miron Abramovici

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