Prashant S. Parikh, Miron Abramovici. On Combining Design for Testability Techniques. In Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995. pages 423-429, IEEE Computer Society, 1995.
@inproceedings{ParikhA95, title = {On Combining Design for Testability Techniques}, author = {Prashant S. Parikh and Miron Abramovici}, year = {1995}, tags = {testing, design}, researchr = {https://researchr.org/publication/ParikhA95}, cites = {0}, citedby = {0}, pages = {423-429}, booktitle = {Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995}, publisher = {IEEE Computer Society}, isbn = {0-7803-2992-9}, }