An aging-aware flip-flop design based on accurate, run-time failure prediction

Junyoung Park, Jacob A. Abraham. An aging-aware flip-flop design based on accurate, run-time failure prediction. In 30th IEEE VLSI Test Symposium, VTS 2012, Maui, Hawaii, USA, 23-26 April 2012. pages 294-299, IEEE, 2012. [doi]

Abstract

Abstract is missing.