Eunsung Park, Won Yong Ha, Doyoon Eom, Dae-Hwan Ahn, Hyuk An, Suhyun Yi, Kyung-Do Kim, Jongchae Kim, Woo-Young Choi, Myung-Jae Lee. Doping-Optimized Back-illuminated Single-Photon Avalanche Diode in Stacked 40 nm CIS Technology Achieving 60% PDP at 905 nm. In 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), Kyoto, Japan, June 11-16, 2023. pages 1-2, IEEE, 2023. [doi]
@inproceedings{ParkHEAAYKKCL23,
title = {Doping-Optimized Back-illuminated Single-Photon Avalanche Diode in Stacked 40 nm CIS Technology Achieving 60% PDP at 905 nm},
author = {Eunsung Park and Won Yong Ha and Doyoon Eom and Dae-Hwan Ahn and Hyuk An and Suhyun Yi and Kyung-Do Kim and Jongchae Kim and Woo-Young Choi and Myung-Jae Lee},
year = {2023},
doi = {10.23919/VLSITechnologyandCir57934.2023.10185229},
url = {https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185229},
researchr = {https://researchr.org/publication/ParkHEAAYKKCL23},
cites = {0},
citedby = {0},
pages = {1-2},
booktitle = {2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), Kyoto, Japan, June 11-16, 2023},
publisher = {IEEE},
isbn = {978-4-86348-806-9},
}