Young Joon Park, Jungwoo Joh, Jayhoon Chung, Srikanth Krishnan. Current Crowding Impact on Electromigration in Al Interconnects. In IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019. pages 1-6, IEEE, 2019. [doi]
Abstract is missing.