GAN-Based Framework for Unified Estimation of Process-Induced Random Variation in FinFET - researchr publication authors

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Taeeon Park, Jihwan Kwak, Hongjoon Ahn, Jinwoong Lee, Jaehyuk Lim, Sangho Yu, Changhwan Shin, Taesup Moon. GAN-Based Framework for Unified Estimation of Process-Induced Random Variation in FinFET. IEEE Access, 10:130001-130023, 2022. [doi]

This author has not been identified. Look up 'Taeeon Park' in GoogleThis author has not been identified. Look up 'Jihwan Kwak' in GoogleThis author has not been identified. Look up 'Hongjoon Ahn' in GoogleThis author has not been identified. Look up 'Jinwoong Lee' in GoogleThis author has not been identified. Look up 'Jaehyuk Lim' in GoogleThis author has not been identified. Look up 'Sangho Yu' in GoogleThis author has not been identified. Look up 'Changhwan Shin' in GoogleThis author has not been identified. Look up 'Taesup Moon' in Google

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