Taeeon Park, Jihwan Kwak, Hongjoon Ahn, Jinwoong Lee, Jaehyuk Lim, Sangho Yu, Changhwan Shin, Taesup Moon. GAN-Based Framework for Unified Estimation of Process-Induced Random Variation in FinFET. IEEE Access, 10:130001-130023, 2022. [doi]
Abstract is missing.