Incremental redundancy to reduce data retention errors in flash-based SSDs

Heejin Park, Jaeho Kim, Jongmoo Choi, Donghee Lee, Sam H. Noh. Incremental redundancy to reduce data retention errors in flash-based SSDs. In IEEE 31st Symposium on Mass Storage Systems and Technologies, MSST 2015, Santa Clara, CA, USA, May 30 - June 5, 2015. pages 1-13, IEEE, 2015. [doi]

Authors

Heejin Park

This author has not been identified. Look up 'Heejin Park' in Google

Jaeho Kim

This author has not been identified. Look up 'Jaeho Kim' in Google

Jongmoo Choi

This author has not been identified. Look up 'Jongmoo Choi' in Google

Donghee Lee

This author has not been identified. Look up 'Donghee Lee' in Google

Sam H. Noh

This author has not been identified. Look up 'Sam H. Noh' in Google