Heejin Park, Jaeho Kim, Jongmoo Choi, Donghee Lee, Sam H. Noh. Incremental redundancy to reduce data retention errors in flash-based SSDs. In IEEE 31st Symposium on Mass Storage Systems and Technologies, MSST 2015, Santa Clara, CA, USA, May 30 - June 5, 2015. pages 1-13, IEEE, 2015. [doi]
@inproceedings{ParkKCLN15,
title = {Incremental redundancy to reduce data retention errors in flash-based SSDs},
author = {Heejin Park and Jaeho Kim and Jongmoo Choi and Donghee Lee and Sam H. Noh},
year = {2015},
doi = {10.1109/MSST.2015.7208279},
url = {http://dx.doi.org/10.1109/MSST.2015.7208279},
researchr = {https://researchr.org/publication/ParkKCLN15},
cites = {0},
citedby = {0},
pages = {1-13},
booktitle = {IEEE 31st Symposium on Mass Storage Systems and Technologies, MSST 2015, Santa Clara, CA, USA, May 30 - June 5, 2015},
publisher = {IEEE},
isbn = {978-1-4673-7619-8},
}