Heejin Park, Jaeho Kim, Jongmoo Choi, Donghee Lee, Sam H. Noh. Incremental redundancy to reduce data retention errors in flash-based SSDs. In IEEE 31st Symposium on Mass Storage Systems and Technologies, MSST 2015, Santa Clara, CA, USA, May 30 - June 5, 2015. pages 1-13, IEEE, 2015. [doi]
Abstract is missing.