Gyusung Park, Minsu Kim, Chris H. Kim, Bongjin Kim, Vijay Reddy. All-digital PLL frequency and phase noise degradation measurements using simple on-chip monitoring circuits. In IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018. pages 5, IEEE, 2018. [doi]
Abstract is missing.