Inconsistent Fail due to Limited Tester Timing Accuracy - researchr publication authors

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Intaik Park, Donghwi Lee, Erik Chmelar, Edward J. McCluskey. Inconsistent Fail due to Limited Tester Timing Accuracy. In 26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA. pages 47-52, IEEE Computer Society, 2008. [doi]

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