Intaik Park, Donghwi Lee, Erik Chmelar, Edward J. McCluskey. Inconsistent Fail due to Limited Tester Timing Accuracy. In 26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA. pages 47-52, IEEE Computer Society, 2008. [doi]
@inproceedings{ParkLCM08,
title = {Inconsistent Fail due to Limited Tester Timing Accuracy},
author = {Intaik Park and Donghwi Lee and Erik Chmelar and Edward J. McCluskey},
year = {2008},
doi = {10.1109/VTS.2008.23},
url = {http://doi.ieeecomputersociety.org/10.1109/VTS.2008.23},
researchr = {https://researchr.org/publication/ParkLCM08},
cites = {0},
citedby = {0},
pages = {47-52},
booktitle = {26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA},
publisher = {IEEE Computer Society},
}