Jaeseok Park, Ingeol Lee, Young-Seok Park, Sung-Geun Kim, Kyungho Ryu, Dong-Hoon Jung, Kangwook Jo, Choong Keun Lee, Hongil Yoon, Seong-Ook Jung, Woo-Young Choi, Sungho Kang. Integration of dual channel timing formatter system for high speed memory test equipment. In International SoC Design Conference, ISOCC 2012, Jeju Island, South Korea, November 4-7, 2012. pages 185-187, IEEE, 2012. [doi]
Abstract is missing.