Yeonhong Park, Seung Yul Lee, Hoon Shin, Jun Heo 0001, Tae Jun Ham, Jae W. Lee. Unlocking Wordline-level Parallelism for Fast Inference on RRAM-based DNN Accelerator. In IEEE/ACM International Conference On Computer Aided Design, ICCAD 2020, San Diego, CA, USA, November 2-5, 2020. pages 1-9, IEEE, 2020. [doi]
Abstract is missing.