A fully integrated Phase-locked loop with leakage current compensation in 65-nm CMOS technology - researchr publication authors

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Se-Chun Park, Seung-Baek Park, Soo-Won Kim. A fully integrated Phase-locked loop with leakage current compensation in 65-nm CMOS technology. In IEEE International Conference on Consumer Electronics, ICCE 2015, Las Vegas, NV, USA, January 9-12, 2015. pages 587-588, IEEE, 2015. [doi]

This author has not been identified. Look up 'Se-Chun Park' in GoogleThis author has not been identified. Look up 'Seung-Baek Park' in GoogleThis author has not been identified. Look up 'Soo-Won Kim' in Google

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