Se-Chun Park, Seung-Baek Park, Soo-Won Kim. A fully integrated Phase-locked loop with leakage current compensation in 65-nm CMOS technology. In IEEE International Conference on Consumer Electronics, ICCE 2015, Las Vegas, NV, USA, January 9-12, 2015. pages 587-588, IEEE, 2015. [doi]
@inproceedings{ParkPK15-4,
title = {A fully integrated Phase-locked loop with leakage current compensation in 65-nm CMOS technology},
author = {Se-Chun Park and Seung-Baek Park and Soo-Won Kim},
year = {2015},
doi = {10.1109/ICCE.2015.7066538},
url = {https://doi.org/10.1109/ICCE.2015.7066538},
researchr = {https://researchr.org/publication/ParkPK15-4},
cites = {0},
citedby = {0},
pages = {587-588},
booktitle = {IEEE International Conference on Consumer Electronics, ICCE 2015, Las Vegas, NV, USA, January 9-12, 2015},
publisher = {IEEE},
isbn = {978-1-4799-7543-3},
}