In Situ SRAM Static Stability Estimation in 65-nm CMOS

Henry Park, Chih-Kong Ken Yang. In Situ SRAM Static Stability Estimation in 65-nm CMOS. J. Solid-State Circuits, 48(10):2541-2549, 2013. [doi]

@article{ParkY13-0,
  title = {In Situ SRAM Static Stability Estimation in 65-nm CMOS},
  author = {Henry Park and Chih-Kong Ken Yang},
  year = {2013},
  doi = {10.1109/JSSC.2013.2275653},
  url = {http://dx.doi.org/10.1109/JSSC.2013.2275653},
  researchr = {https://researchr.org/publication/ParkY13-0},
  cites = {0},
  citedby = {0},
  journal = {J. Solid-State Circuits},
  volume = {48},
  number = {10},
  pages = {2541-2549},
}