Cumulant characterizations of ADC error sources with applications to Time Interleaved ADCs - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Charna R. Parkey, Wasfy B. Mikhael, David B. Chester. Cumulant characterizations of ADC error sources with applications to Time Interleaved ADCs. In 55th IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2012, Boise, ID, USA, August 5-8, 2012. pages 1152-1155, IEEE, 2012. [doi]

This author has not been identified. Look up 'Charna R. Parkey' in GoogleThis author has not been identified. Look up 'Wasfy B. Mikhael' in GoogleThis author has not been identified. Look up 'David B. Chester' in Google

runs on WebDSL