Charna R. Parkey, Wasfy B. Mikhael, David B. Chester. Cumulant characterizations of ADC error sources with applications to Time Interleaved ADCs. In 55th IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2012, Boise, ID, USA, August 5-8, 2012. pages 1152-1155, IEEE, 2012. [doi]
@inproceedings{ParkeyMC12,
title = {Cumulant characterizations of ADC error sources with applications to Time Interleaved ADCs},
author = {Charna R. Parkey and Wasfy B. Mikhael and David B. Chester},
year = {2012},
doi = {10.1109/MWSCAS.2012.6292229},
url = {https://doi.org/10.1109/MWSCAS.2012.6292229},
researchr = {https://researchr.org/publication/ParkeyMC12},
cites = {0},
citedby = {0},
pages = {1152-1155},
booktitle = {55th IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2012, Boise, ID, USA, August 5-8, 2012},
publisher = {IEEE},
isbn = {978-1-4673-2526-4},
}