A 16-bit resistor string DAC with full-calibration at final test

Kumar L. Parthasarathy, Turker Kuyel, Zhongjun Yu, Degang Chen, Randall L. Geiger. A 16-bit resistor string DAC with full-calibration at final test. In Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005. pages 10, IEEE, 2005. [doi]

@inproceedings{ParthasarathyKYCG05,
  title = {A 16-bit resistor string DAC with full-calibration at final test},
  author = {Kumar L. Parthasarathy and Turker Kuyel and Zhongjun Yu and Degang Chen and Randall L. Geiger},
  year = {2005},
  doi = {10.1109/TEST.2005.1583962},
  url = {http://doi.ieeecomputersociety.org/10.1109/TEST.2005.1583962},
  researchr = {https://researchr.org/publication/ParthasarathyKYCG05},
  cites = {0},
  citedby = {0},
  pages = {10},
  booktitle = {Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005},
  publisher = {IEEE},
  isbn = {0-7803-9038-5},
}