A 16-bit resistor string DAC with full-calibration at final test

Kumar L. Parthasarathy, Turker Kuyel, Zhongjun Yu, Degang Chen, Randall L. Geiger. A 16-bit resistor string DAC with full-calibration at final test. In Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005. pages 10, IEEE, 2005. [doi]

Abstract

Abstract is missing.