Ishwar Parulkar, Robert Cypher. Trends and Trade-Offs in Designing Highly Robust Throughput Computing Oriented Chips and Systems. In 11th IEEE International On-Line Testing Symposium (IOLTS 2005), 6-8 July 2005, Saint Raphael, France. pages 74-77, IEEE Computer Society, 2005. [doi]
@inproceedings{ParulkarC05,
title = {Trends and Trade-Offs in Designing Highly Robust Throughput Computing Oriented Chips and Systems},
author = {Ishwar Parulkar and Robert Cypher},
year = {2005},
doi = {10.1109/IOLTS.2005.68},
url = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2005.68},
researchr = {https://researchr.org/publication/ParulkarC05},
cites = {0},
citedby = {0},
pages = {74-77},
booktitle = {11th IEEE International On-Line Testing Symposium (IOLTS 2005), 6-8 July 2005, Saint Raphael, France},
publisher = {IEEE Computer Society},
isbn = {0-7695-2406-0},
}