Ishwar Parulkar, Robert Cypher. Trends and Trade-Offs in Designing Highly Robust Throughput Computing Oriented Chips and Systems. In 11th IEEE International On-Line Testing Symposium (IOLTS 2005), 6-8 July 2005, Saint Raphael, France. pages 74-77, IEEE Computer Society, 2005. [doi]
Abstract is missing.