Ishwar Parulkar, Dawei Huang, Leandro Chua Jr., Drew Doblar. Testing throughput computing interconnect topologies with Tbits/sec bandwidth in manufacturing and in field. In Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005. pages 9, IEEE, 2005. [doi]
Abstract is missing.