Bertrand Parvais, S. Hu, Morin Dehan, Abdelkarim Mercha, Stefaan Decoutere. An Accurate Scalable Compact Model for the Substrate Resistance of RF MOSFETs. In Proceedings of the IEEE 2007 Custom Integrated Circuits Conference, CICC 2007, DoubleTree Hotel, San Jose, California, USA, September 16-19, 2007. pages 503-506, IEEE, 2007. [doi]
Abstract is missing.