A digital intensive circuit for low-frequency noise monitoring in 28nm CMOS - researchr publication authors

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Bertrand Parvais, Piet Wambacq, Abdelkarim Mercha, Diederik Verkest, Aaron Thean, Ken Sawada, Kazuki Nomoto, Tetsuya Oishi, Hiroaki Ammo. A digital intensive circuit for low-frequency noise monitoring in 28nm CMOS. In IEEE Asian Solid-State Circuits Conference, A-SSCC 2015, Xia'men, China, November 9-11, 2015. pages 1-4, IEEE, 2015. [doi]

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