Contact resistance Study of "edge-contacted" metal-graphene interfaces

Vikram Passi, Amit Gahoi, J. Ruhkopf, Satender Kataria, F. Vaurette, E. Pallecchi, H. Happy, Max C. Lemme. Contact resistance Study of "edge-contacted" metal-graphene interfaces. In 46th European Solid-State Device Research Conference, ESSDERC 2016, Lausanne, Switzerland, September 12-15, 2016. pages 236-239, IEEE, 2016. [doi]

Abstract

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