Thermal-Safe Dynamic Test Scheduling Method Using On-Chip Temperature Sensors for 3D MPSoCs

Rama Kumar Pasumarthi, V. R. Devanathan, V. Visvanathan, Seetal Potluri, V. Kamakoti. Thermal-Safe Dynamic Test Scheduling Method Using On-Chip Temperature Sensors for 3D MPSoCs. J. Low Power Electronics, 8(5):684-695, 2012. [doi]

Authors

Rama Kumar Pasumarthi

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V. R. Devanathan

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V. Visvanathan

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Seetal Potluri

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V. Kamakoti

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