Rama Kumar Pasumarthi, V. R. Devanathan, V. Visvanathan, Seetal Potluri, V. Kamakoti. Thermal-Safe Dynamic Test Scheduling Method Using On-Chip Temperature Sensors for 3D MPSoCs. J. Low Power Electronics, 8(5):684-695, 2012. [doi]
@article{PasumarthiDVPK12,
title = {Thermal-Safe Dynamic Test Scheduling Method Using On-Chip Temperature Sensors for 3D MPSoCs},
author = {Rama Kumar Pasumarthi and V. R. Devanathan and V. Visvanathan and Seetal Potluri and V. Kamakoti},
year = {2012},
doi = {10.1166/jolpe.2012.1226},
url = {http://dx.doi.org/10.1166/jolpe.2012.1226},
researchr = {https://researchr.org/publication/PasumarthiDVPK12},
cites = {0},
citedby = {0},
journal = {J. Low Power Electronics},
volume = {8},
number = {5},
pages = {684-695},
}