Tanish Patel, Ramalingam Murugan, Gokul Yenduri, Rutvij H. Jhaveri, Hichem Snoussi, Tarek Gaber. Demystifying Defects: Federated Learning and Explainable AI for Semiconductor Fault Detection. IEEE Access, 12:116987-117007, 2024. [doi]
Abstract is missing.