Harsh N. Patel, Farah B. Yahya, Benton H. Calhoun. Optimizing SRAM bitcell reliability and energy for IoT applications. In 17th International Symposium on Quality Electronic Design, ISQED 2016, Santa Clara, CA, USA, March 15-16, 2016. pages 12-17, IEEE, 2016. [doi]
Abstract is missing.