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Stability Analysis of SRAM Designed Using In0.53Ga0.47As nFinFET with Underlap Region

Jay Pathak, A. D. Darji. Stability Analysis of SRAM Designed Using In0.53Ga0.47As nFinFET with Underlap Region. In 32nd International Conference on VLSI Design and 2019 18th International Conference on Embedded Systems, VLSID 2019, Delhi, India, January 5-9, 2019. pages 502-503, IEEE, 2019. [doi]

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