Jay Pathak, Anand D. Darji. Analysis of Standard Cells performance for In0.53Ga0.47As FinFET with underlap fin length for High Speed Applications. In 25th International Symposium on VLSI Design and Test, VDAT 2021, Surat, India, September 16-18, 2021. pages 1-4, IEEE, 2021. [doi]
Abstract is missing.