Parallel Test Generation for Sequential Circuits on General-Purpose Multiprocessors

Srinivas Patil, Prithviraj Banerjee, Janak H. Patel. Parallel Test Generation for Sequential Circuits on General-Purpose Multiprocessors. In DAC. pages 155-159, 1991. [doi]

References

No references recorded for this publication.

Cited by

No citations of this publication recorded.