Meru A. Patil, Ravindra B. Patil, P. Krishnamoorthy, Jacob John. A machine learning framework for auto classification of imaging system exams in hospital setting for utilization optimization. In 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2016, Orlando, FL, USA, August 16-20, 2016. pages 2423-2426, IEEE, 2016. [doi]
Abstract is missing.