Somnath Paul, Swarup Bhunia. VAIL: variation-aware issue logic and performance binning for processor yield and profit improvement. In Vojin G. Oklobdzija, Barry Pangle, Naehyuck Chang, Naresh R. Shanbhag, Chris H. Kim, editors, Proceedings of the 2010 International Symposium on Low Power Electronics and Design, 2010, Austin, Texas, USA, August 18-20, 2010. pages 37-42, ACM, 2010. [doi]
Abstract is missing.