Somnath Paul, Rajat Subhra Chakraborty, Swarup Bhunia. VIm-Scan: A Low Overhead Scan Design Approach for Protection of Secret Key in Scan-Based Secure Chips. In 25th IEEE VLSI Test Symposium (VTS 2007), 6-10 May 2007, Berkeley, California, USA. pages 455-460, IEEE Computer Society, 2007. [doi]
@inproceedings{PaulCB07:0,
title = {VIm-Scan: A Low Overhead Scan Design Approach for Protection of Secret Key in Scan-Based Secure Chips},
author = {Somnath Paul and Rajat Subhra Chakraborty and Swarup Bhunia},
year = {2007},
doi = {10.1109/VTS.2007.89},
url = {http://dx.doi.org/10.1109/VTS.2007.89},
tags = {design, systematic-approach},
researchr = {https://researchr.org/publication/PaulCB07%3A0},
cites = {0},
citedby = {0},
pages = {455-460},
booktitle = {25th IEEE VLSI Test Symposium (VTS 2007), 6-10 May 2007, Berkeley, California, USA},
publisher = {IEEE Computer Society},
}