Design of a soft error resilient 13T SRAM architecture for radiation-prone environments in FinFET 18 nm technology

Anish Paul, Siya Sharma, Kulbhushan Sharma. Design of a soft error resilient 13T SRAM architecture for radiation-prone environments in FinFET 18 nm technology. Integration, 106:102574, 2026. [doi]

Abstract

Abstract is missing.