Svetlana Pavlitskaya, Joël Oswald, J. Marius Zöllner. Measuring Overfitting in Convolutional Neural Networks using Adversarial Perturbations and Label Noise. In Hisao Ishibuchi, Chee-Keong Kwoh 0001, Ah-Hwee Tan, Dipti Srinivasan, Chunyan Miao, Anupam Trivedi, Keeley A. Crockett, editors, IEEE Symposium Series on Computational Intelligence, SSCI 2022, Singapore, December 4-7, 2022. pages 1551-1559, IEEE, 2022. [doi]
Abstract is missing.