Robert Pawlowski, Joseph Crop, Minki Cho, James Tschanz, Vivek De, Thomas Fairbanks, Heather Quinn, Shekhar Y. Borkar, Patrick Yin Chiang. Characterization of radiation-induced SRAM and logic soft errors from 0.33V to 1.0V in 65nm CMOS. In Proceedings of the IEEE 2014 Custom Integrated Circuits Conference, CICC 2014, San Jose, CA, USA, September 15-17, 2014. pages 1-4, IEEE, 2014. [doi]
Abstract is missing.