Piotr Pawlowski, Andrzej Guzinski. Comparative investigations of substrate noise caused by voltage-mode and current-mode gates. In IEEE International Symposium on Circuits and Systems, ISCAS 2000, Emerging Technologies for the 21st Century, Geneva, Switzerland, 28-31 May 2000, Proceedings. pages 561-564, IEEE, 2000. [doi]
Abstract is missing.