Bruna Cardoso Paz, Mikaël Casse, Sylvain Barraud, Gilles Reimbold, Olivier Faynot, F. Avila-Herrera, Antonio Cerdeira, Marcelo Antonio Pavanello. Drain current model for short-channel triple gate junctionless nanowire transistors. Microelectronics Reliability, 63:1-10, 2016. [doi]
Abstract is missing.