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eWASM: Practical Software Fault Isolation for Reliable Embedded Devices

Gregor Peach, Runyu Pan, Zhuoyi Wu, Gabriel Parmer, Christopher Haster, Ludmila Cherkasova. eWASM: Practical Software Fault Isolation for Reliable Embedded Devices. IEEE Trans. on CAD of Integrated Circuits and Systems, 39(11):3492-3505, 2020. [doi]

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Gregor Peach

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Runyu Pan

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Zhuoyi Wu

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Gabriel Parmer

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Christopher Haster

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Ludmila Cherkasova

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