Gregor Peach, Runyu Pan, Zhuoyi Wu, Gabriel Parmer, Christopher Haster, Ludmila Cherkasova. eWASM: Practical Software Fault Isolation for Reliable Embedded Devices. IEEE Trans. on CAD of Integrated Circuits and Systems, 39(11):3492-3505, 2020. [doi]
@article{PeachPWPHC20,
title = {eWASM: Practical Software Fault Isolation for Reliable Embedded Devices},
author = {Gregor Peach and Runyu Pan and Zhuoyi Wu and Gabriel Parmer and Christopher Haster and Ludmila Cherkasova},
year = {2020},
doi = {10.1109/TCAD.2020.3012647},
url = {https://doi.org/10.1109/TCAD.2020.3012647},
researchr = {https://researchr.org/publication/PeachPWPHC20},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {39},
number = {11},
pages = {3492-3505},
}