Automatic Discovery of RTL Benchmark Circuits with Predefined Testability Properties - researchr publication authors

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Tomas Pecenka, Zdenek Kotásek, Lukás Sekanina, Josef Strnadel. Automatic Discovery of RTL Benchmark Circuits with Predefined Testability Properties. In 2005 NASA / DoD Conference on Evolvable Hardware (EH 2005), 29 June - 1 July 2005, Washington, DC, USA. pages 51-58, IEEE Computer Society, 2005. [doi]

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