Tomas Pecenka, Zdenek Kotásek, Lukás Sekanina, Josef Strnadel. Automatic Discovery of RTL Benchmark Circuits with Predefined Testability Properties. In 2005 NASA / DoD Conference on Evolvable Hardware (EH 2005), 29 June - 1 July 2005, Washington, DC, USA. pages 51-58, IEEE Computer Society, 2005. [doi]
@inproceedings{PecenkaKSS05, title = {Automatic Discovery of RTL Benchmark Circuits with Predefined Testability Properties}, author = {Tomas Pecenka and Zdenek Kotásek and Lukás Sekanina and Josef Strnadel}, year = {2005}, doi = {10.1109/EH.2005.10}, url = {http://doi.ieeecomputersociety.org/10.1109/EH.2005.10}, tags = {discovery, testing}, researchr = {https://researchr.org/publication/PecenkaKSS05}, cites = {0}, citedby = {0}, pages = {51-58}, booktitle = {2005 NASA / DoD Conference on Evolvable Hardware (EH 2005), 29 June - 1 July 2005, Washington, DC, USA}, publisher = {IEEE Computer Society}, isbn = {0-7695-2399-4}, }